ncvet-help[at]gov[dot]in
Beta Version
+91 11 25788001-11

Essentials of Device Characterization and Testing

NQR Code:NG-4.5-EH-03732-2025-V1-NIELIT

  • Old Code: NG-4.5-EH-03732-2025-V1-NIELIT

    Copy
About this Qualification

Job Description

The Standalone NOS "Essentials of Device Characterization and Testing" focuses on understanding the fundamental techniques used to evaluate and measure the electrical properties of semiconductor devices such as diodes, transistors, and integrated circuits. This includes analyzing parameters like current-voltage (I-V) characteristics, capacitance, mobility, threshold voltage, and response time under various conditions. The goal is to ensure device performance, reliability, and functionality in real-world applications. Accurate characterization and testing are essential in research, quality control, and manufacturing to meet industry standards and design specifications.

Eligibility Criteria

Criteria 1 Criteria 2 Experience Training Qualification
UG 1st year In relevant field No Experience None
3rd Year of 3 Year Diploma after 10th In relevant field No Experience None
12th Passed 1.5 Years None
3 year Diploma after 10th In relevant field No Experience None
10th Passed 1.5 Years 2 year NTC

Progression Pathway

  • MEMS Backend Fabrication Engineer -> Semiconductor Fabrication Engineer

Learning Module In Job Role/Qualifcation

National Occupation Standards (NOS)/Module NOS Code Mandatory/ Optional Estimated size (Hours) Nos Credit Level
Essentials of Device Characterization and Testing NIE/ELE/N3306 Mandatory 60 2 4.5